Domestic Conference
Evaluation of Contact Resistance Measurement Methods in Solution-Processed Carbon Nanotube Thin-Film Transistors
- Author M. Kang, H. Yoo, and Y. Hong*
- Presenter M. Kang
- Conference The 30th Korean Conference on Semiconductors (KCS 2023)
- Date February (2023) (poster)
- Year 2023
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이전글Resistance Modulation of Surfactant-Modified PEDOT:PSS by Selective Irradiation of Ultraviolet for Patterned Transparent Conductive Electrodes
다음글Highly Conformable, Conductive Ultra-Thin PDMS Film Embedded with Silver Nanowires
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