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Introduction
About AXEL
Contact
Equipment
Research
Research Scope
Next-Gen Display
Human-Machine Interface
Innovative Circuitry
People
Professor
Members
Alumni
Project
On-going
Completed
Publication
International Journal
International Conference
Domestic Journal
Domestic Conference
Patent
Board
News
Gallery
SID student branch
Equipment
Introduction
About AXEL
Contact
Equipment
Probe Station (프로브 스테이션)
Precise Electrical Measurement Stage
- Chuck size: 6-inch wafer compatible
업로드 #1
슬라이드16.JPG
(142,082 byte)
이전글
Four Point Probe (면저항 측정기)
다음글
Sourcemeter (소스미터)
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