주메뉴 바로가기
본문 바로가기
Introduction
About AXEL
Contact
Equipment
Research
Research Scope
Next-Gen Display
Human-Machine Interface
Innovative Circuitry
People
Professor
Members
Alumni
Project
On-going
Completed
Publication
International Journal
International Conference
Domestic Journal
Domestic Conference
Patent
Board
News
Gallery
SID student branch
Login
Login
Introduction
About AXEL
Contact
Equipment
Research
Research Scope
Next-Gen Display
Human-Machine Interface
Innovative Circuitry
People
Professor
Members
Alumni
Project
On-going
Completed
Publication
International Journal
International Conference
Domestic Journal
Domestic Conference
Patent
Board
News
Gallery
SID student branch
Equipment
Introduction
About AXEL
Contact
Equipment
Four Point Probe (면저항 측정기)
A device used to evaluate the sheet resistance of a thin film
- Pitch : 1mm (connected with Keithley 2400)
- Manual stage
업로드 #1
슬라이드12.JPG
(57,872 byte)
이전글
Precision LCR Meter (정밀 LCR 미터)
다음글
Probe Station (프로브 스테이션)
목록보기
푸터정보